Speaker: Prof. Gianluigi Botton
Affiliation: Canadian Light Source, Saskatoon, SK and Dept of Materials Science and Engineering,
McMaster University, Hamilton
Date and time: Friday, October 18, 2019, 12 – 1 PM
Location: Galbraith Building, 35 St George St, Room 221
Abstract: Electron microscopes have become very power tools to study the structure of materials at unprecedented resolution. From their invention, these tools have provided essential information on the structure and properties of the broadest range of materials used today in structural and functional applications. However, electron microscopes provide much more than images. In this presentation, the major breakthroughs in the field of electron microscopy of the last few decades will be presented. It will be shown that, in addition to images, electron microscopes provide much more than structural information with techniques such as electron energy loss spectroscopy and scanning transmission electron microscopy. Several examples related to the analysis of nanoscale energy storage and conversion materials, semiconductors and alloys will be presented. This work demonstrates that one can study where atoms are in a solid, or in a defect, with exceptional precision and accuracy so that even the strain field at interfaces, in devices and around defects can be obtained. Examples also show that spectroscopic information on the valence of atoms, even in complex materials such as high-temperature superconductors can be obtained at atomic resolution. The use of complementary characterization tools, such 3D-atom probe tomography and various synchrotrons beamlines, highlights the powerful arsenal available to materials scientists and engineers to understand the behavior and properties of materials with the latest characterization techniques, whether with electrons of photons. I will conclude with highlights of plans for the development of the next generation photon source in Canada for materials research.