This session, led by a Keithley Applications Engineer, will explore the challenges and best
practices in low current and low voltage measurements using the Keithley 4200A-SCS
Parameter Analyzer.
Gain practical insights into optimizing their setups for device characterization, enhancing
measurement accuracy, and overcoming noise, leakage, and connection limitations
common in lab and wafer-level testing. Whether you’re testing nanoscale devices,
advanced semiconductors, or novel materials, this seminar will give you the knowledge to
get the most out of your instrumentation.